JOPSS - Search Results

Journal Articles

Aperiodic multilayer structures in soft X-ray optics

Pirozhkov, A. S.; Ragozin, E. N.*

Physics-Uspekhi, 58(11), p.1095 - 1105, 2015/11

https://doi.org/10.3367/UFNe.0185.201511e.1203

Times Cited Count：29 Percentile：56.75(Physics, Multidisciplinary)

Journal Articles

Study of interdiffused layers in the surface and interfaces of multilayers by total-reflection soft-X-ray fluorescence spectroscopy

Imazono, Takashi; Yanagihara, Mihiro*

Photon Factory News, 22(3), p.18 - 22, 2004/11

Using soft-X-ray fluorescence spectroscopy with photon incidence at a critical angle of total reflection, it was made clear that SiO existed within a depth of a few nanometers from the surface of Fe/Si multilayers. It was generated by oxidation of the interdiffused FeSi layer nearest to the topmost Fe layer. Consequently, the FeSi layer was found to decrease in thickness. This result suggests that the total-reflection soft-X-ray fluorescence spectroscopy is fairly useful to analyze the chemical state of elements to a depth of a few nanometers from the surface.

Journal Articles

Magnetic structure of spin-density waves in Cr(001)/Sn multilayers with periodic monatomic spacer layers of nonmagnetic Sn

Takeda, Masayasu; Mibu, Ko*; Shinjo, Teruya*; Endo, Yasuo*; Suzuki, Junichi

Physical Review B, 70(10), p.104408_1 - 104408_9, 2004/09

https://doi.org/10.1103/PhysRevB.70.104408

Times Cited Count：8 Percentile：41.01(Materials Science, Multidisciplinary)

Detailed magnetic structure of spin-density waves (SDWs) in epitaxial Cr(001)/Sn multilayer was investigated by neutron scattering combined with Mssbauer spectroscopic studies. Monatomic Sn layers were embedded in 240 nm thick Cr(001) films with varying the periodic spacing from 4.2 to 16.2 nm. All samples were revealed to be a commensurate antiferromagnetic (CAF) phase at 300 K. The CAF structures changed to incommensurate SDW states with complex waveforms whose wavelength are controlled by the artificial periodicity at low temperatures although the CAF structure in the sample with the period of 4.2 nm persisted even at 10 K. The phase transition depends on the thickness of the Cr layers intervening between Sn monatomic layers. An appreciable phase slip in the SDW was observed during the phase transition in the sample with the period of 10.2 nm. The SDW structure is discussed by taking account of the competing forces between the nesting of Fermi surface and a pinning of antinodes at the Sn monatomic layers.

Journal Articles

Growth-orientation dependence of magnetic properties of Cr-based multilayers with $^{119}$ Sn monatomioc layers

Jiko, Norihiro*; Almokhtar, M.*; Takeda, Masayasu; Suzuki, Junichi; Shinjo, Teruya*; Mibu, Ko*

Journal of Magnetism and Magnetic Materials, 272-276(Part2), p.1233 - 1234, 2004/05

The growth-orientation dependence of magnetism of Cr/Sn and Fe/Cr/Sn/Cr multilayers was studied. For Fe/Cr/Sn/Cr multilayers, reduction of Cr magnetic moments was found in both (011)- and (001)-orientated samples, and the effect is larger in the former than the latter. In Cr/Sn multilayers, the (011)-oriented sample with the Cr layer thickness ( $_{Cr}$ ) of 80 $_{Cr}$ 80AA have a spin-density-wave structure with the wave vector perpendicular to the film plane.

JAEA Reports

Development of a simulation code for the neutron diffuse scattering from multilayers

Soyama, Kazuhiko; Cao, B.*

JAERI-Research 2003-031, 42 Pages, 2004/03

JAERI-Research-2003-031.pdf:1.28MB

We have established a model to analyze the diffuse neutron scattering for Ni/Ti multilayers with DWBA calculation. Three kind of scan type have been adopted to investigate the features of the scattered intensities. Good agreement between the measurement around rocking scan and the calculation following the concept of DWBA has been achieved in this paper.

Journal Articles

Nuclear power plant simulation using multilayer perceptron

Ono, Tomio*; Subekti, M.*; Maruyama, Yuta*; Nabeshima, Kunihiko; Kudo, Kazuhiko*

Dai-13-Kai Interijento, Shisutemu, Shimpojiumu Koen Rombunshu, p.212 - 217, 2003/12

In this research, we present nuclear power plant simulation method using Multilayer Perceptron, which is one of the models of Artificial Neural Networks(ANNs). The major characteristics of ANNs are to obtain the model through learning, analogy and very high speed processing. Furthermore, 'time synchronizing signal' and 'progress synchronizing signal' are added as the inputs to adapt the abnormal events with various scales or progress rates. This ANN, learned some sample data, can be flexibly adapted to simulate the abnormal events with different scales including explicit progress rates. In the verification using PWR simulator, we confirmed that this method could model NPP abnormal events by learning data and simulate the data which have different progress rates from learning data.

Journal Articles

Recent activities and progress on PORE reflectometer

Takeda, Masayasu; Torikai, Naoya*; Ino, Takashi*; Tasaki, Seiji*

KENS Report-XIV, p.205 - 206, 2003/00

no abstracts in English

Journal Articles

Alternate multilayer deposition from ammonium amphiphiles and titanium dioxide crystalline nanosheets using the Langmuir-Blodgett technique

Yamaki, Tetsuya; Asai, Keisuke*

Langmuir, 17(9), p.2564 - 2567, 2001/05

https://doi.org/10.1021/la0016423

Times Cited Count：41 Percentile：92.2(Chemistry, Multidisciplinary)

A new type of TiO $_{2}$ nanosheet-organic complex multilayer film was successfully prepared by the Langmuir-Blodgett technique. Surface pressure-area curves demonstrated that a stable monolayer of dioctadecyldimethylammonium bromide (DODAB) was formed on an aqueous suspension of TiO $_{2}$ nanosheets derived from an exfoliated layered titanate, H $_{x}$ Ti $_{2-x/4}$ □ $_{x/4}$ O $_{4}$ ・H $_{2}$ O (x0.7; □, vacancy). The hybrid monolayer of the ammonium amphiphiles and the TiO $_{2}$ nanosheet was quantitatively transferred onto a hydrophobic quartz plate to form a multilayer film. X-ray diffraction measurements confirmed the formation of an ordered structure of DODAB/TiO $_{2}$ with an interlayer distance of 3.4 nm.